The CAST (Collaborative Alliance for Semiconductor Test) group invites
you to attend a one-day Workshop on "Adaptive Test" to be held on
Tuesday March 6th at SEMI Headquarters in San Jose, California.
The one-day seminar will start with presentations by a panel of leaders on the topic and will quickly transition into a highly interactive working session to identify the pre-competitive elements of adaptive test that need to be addressed for the industry to realize the benefits. The objective is to identify these elements and develop a cohesive direction for a working group to set the definitions and standards. For more information, please visit: http://www.semi.org/en/node/40616
San Jose, CA USA
Tuesday, March 06, 2012
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