For c-Si technology, one of the problems is to identify and eliminate the sources of mechanical defects such as thermo-elastic stress and cracks leading to the loss of wafer integrity and ultimate breakage of as-grown and processed Si cells. A significant challenge in using thinner crystalline silicon wafers for solar cell manufacture is the reduced yield due to increased cell breakage. Cell breakage mostly depends on the stresses induced in the processing, handling and transportation, and also depends on the presence of defects such as micro-cracks. Shipping damage is always one of the top problems of the PV failures in the field.

This Standard presents a test method for mechanical vibration of c-Si PV cells in transportation environment, which might be carried by truck, train, aircraft and shipboard, etc. This Standard aims to provide a common test method to evaluate the micro-cracks or defects on the PV cells due to stress during transportation. The cell makers and buyers, or any other party interested, can thus have a common testing standard to refer to when desired.

The test result also can evaluate cell package performance during transportation.

Basic Test System Requirements — This Standard states the basic vibration test system requirements.

This Test Method covers the random vibration test of filled transportation unit, will be used to assess the performance of package design for mono/multicrystalline cells during shipping by different transportation vehicles.