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SEMI Downloads
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Volumes(s): Equipment Automation Hardware
Language: English
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SEMI E124-1107 - Guide for Definition and Calculation of Overall Factory Efficiency (OFE) and Other Associated Factory-Level Productivity Metrics |
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SEMI Standards Copyright Policy/License Agreements |
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Status |
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CURRENT - Supported by the technical committee. |
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Abstract |
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This standard was technically approved by the global Metrics Committee. This
edition was approved for publication by the global Audits & Reviews
Subcommittee on September 5, 2007. It was available at www.semi.org in October
2007. Originally published July 2003; previously published November 2003.
This guide describes metrics that show how well a factory is operating
compared to how well it could be operating (for the given product mix). These
metrics can be used for tracking factory performance (in value-added production)
in a way that rewards good operational decisions and that is not easy to
adversely manipulate. The metrics can be used in a process of ongoing
improvement that can be visible to all levels of a semiconductor manufacturing
organization. The metrics in this guide are intended for evaluating the relative
efficiency of factory production after the factory is in production, not for
capacity analysis while the factory is being designed or redesigned. However,
some of these metrics can be used in factory simulations for choosing equipment
sets and scheduling policies. |
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Referenced SEMI Standards |
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SEMI E10 — Specification for Definition and
Measurement of Equipment Reliability, Availability, and Maintainability
(RAM)
SEMI E35 — Guide to Calculate Cost of
Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
SEMI E58 — Automated Reliability,
Availability, and Maintainability Standard (ARAMS): Concepts, Behavior, and
Services
SEMI E79 — Specification for Definition and
Measurement of Equipment Productivity
SEMI E116 — Specification for Equipment
Performance Tracking
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Revision History: |
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SEMI E124-1107 (technical revision)
SEMI E124-1103 (technical revision)
SEMI E124-0703 (first published) |
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